Two alumni of Greenwood High International School have secured first place in the poster competition at Purdue University's ...

“Semiconductor lithography inspection requires reliable detection of small pattern defects such as bridge, burr, pinch, and contamination. In this study, we propose a two-stage vision-language ...

AI plays a role in improving defect capture rate and distinguishing between yield-killing and nuisance defects. New developments in wafer edge inspection are proving essential to bonded wafer yields.

Researchers in China have developed a novel deep learning model to detect defects in photovoltaic panels. The approach leverages high-resolution visible light imaging to identify defects using an ...