Two alumni of Greenwood High International School have secured first place in the poster competition at Purdue University's ...

AI plays a role in improving defect capture rate and distinguishing between yield-killing and nuisance defects. New developments in wafer edge inspection are proving essential to bonded wafer yields.

Researchers in China have developed a novel deep learning model to detect defects in photovoltaic panels. The approach leverages high-resolution visible light imaging to identify defects using an ...