EDN

Rack instrument unites JTAG, functional test

The DataBlaster JT 37×7 rack-mounted instrument (RMI) lets users combine boundary-scan test with functional validation. The RMI supports all boundary-scan test applications, including IEEE 1149.6 ...
Electronic Design

Common Core ATE for Functional Testing

The approach to high-end aerospace/defense test system development is shifting from application-specific systems to common core automated systems to reduce overall cost and increase flexibility.
EDN

Combining functional and in-circuit test

CheckSum’s Analyst ems+ft system combines in-circuit test (ICT) and functional test to target OEMs and contract manufacturers building power supplies, automotive electronics, medical electronics, ...
Semiconductor Engineering

Device Validation: The Ultimate Test Frontier

This article is a condensed version of an article that appeared in the November/December 2022 issue of Chip Scale Review. Adapted with permission. Read the original ...
Electronic Design

Embedded Test Complements Boundary Scan

Companies specializing in circuit board and system design-for-test (DFT) tools are pursuing a variety of strategies to serve test and debug applications based on innovations they announced over the ...