A technical paper titled “Detection of defective chips from nanostructures with a high-aspect ratio using hyperspectral imaging and deep learning” was published by researchers at Samsung Electronics.

Industrial automation is moving beyond rigid rule-based control systems toward environments where machines can interpret ...

How do you know if it's time to replace your computer monitor before it dies suddenly on you? Here are some signs your ...

Ninehundred's Incident Watch Camera is now Network Rail-approved for remote trackside monitoring — cutting the need for site ...

[Stay on top of transportation news: Get TTNews in your inbox.] DETROIT — Tesla is recalling nearly all vehicles sold in the U.S., more than 2 million, to update software and fix a defective system ...

MILPITAS, Calif., July 10, 2018 /PRNewswire/ -- Today KLA-Tencor Corporation (NASDAQ: KLAC) announced two new defect inspection products, addressing two key challenges in tool and process monitoring ...