The industry’s insatiable need for power in high-performance computing (HPC) is creating problems for test cells, which need to deliver very high currents at very consistent voltage levels through the ...

Yokogawa said its latest high-voltage, wide-bandwidth probe can stay on top of the faster switching speeds of next-generation power electronics like SiC. A new high-voltage, wide-bandwidth probe gives ...

Semiconductor testing has traditionally functioned as a stable screening step in the manufacturing flow so that failing ...

NORTH READING, Mass.--(BUSINESS WIRE)-- Teradyne, a leading provider of automated test equipment, has partnered with ficonTEC, a global leader in production solutions for photonics assembly and test, ...

Testing multiple devices at the same time is not providing the equivalent reduction in overall test time due to a combination of test execution issues, the complexity of the devices being tested, and ...

STAr Technologies, a leading supplier of semiconductor test probe cards, unveils a new one-touch Aries-Prima Memory Test probe card. The probe card is designed specifically to meet the current high ...