Automatic test-pattern generation (ATPG) has played a key role in semiconductor logic test, but several trends driving the need for semiconductor test quality are challenging traditional ATPG tools.

Reducing the time spent on silicon bring-up is critical in getting ICs into the hands of customers and staying competitive. Typically, the silicon bring-up process involves converting the test ...

Mountain View, CA. Synopsys Inc. on Tuesday announced its next-generation ATPG and diagnostics solution, TetraMAX II, incorporating the innovative test engines unveiled at the International Test ...