AI tools are frequently used in data visualization — this article describes how they can make data preparation more efficient ...
PCA and K-means clustering applied to Raman and PL imaging reveal structural defects in silicon wafers, enhancing understanding of optoelectronic performance.
1 Department of Computer and Instructional Technologies Education, Gazi Faculty of Education, Gazi University, Ankara, Türkiye. 2 Department of Forensic Informatics, Institute of Informatics, Gazi ...
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